Re: [v2 3/3] serial: 8250_dw: Add UPF_SKIP_TEST to flags depend on device tree
On Sun, Jul 26, 2015 at 07:54:38AM +0300, Noam Camus wrote: > From: Noam Camus <noamc@ezchip.com> > > Add support for OF option "no-loopback-test" > > use case: simulator which does not implements loopback test mode.