Messages in this thread | | | From | Lad Prabhakar <> | Subject | [PATCH v4 0/3] media: i2c: ov772x: Enable BT656 mode and test pattern support | Date | Sun, 13 Sep 2020 19:42:44 +0100 |
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Hi All,
This patch series adds support for BT656 mode in the ov772x sensor and also enables color bar test pattern control.
Cheers, Prabhakar
Changes for v4: * New patch 1/3 to fallback in parallel mode. * Switched to v4l2_fwnode_endpoint_alloc_parse() for parsing the ep. * Dropped support for pdat for test pattern control. * DT documentation patches [1].
Changes for v3: * Dropped DT binding documentation patch as this is handled by Jacopo. * Fixed review comments pointed by Jacopo.
[1] https://patchwork.kernel.org/project/linux-renesas-soc/list/?series=346809
Lad Prabhakar (3): media: i2c: ov772x: Parse endpoint properties media: i2c: ov772x: Add support for BT656 mode media: i2c: ov772x: Add test pattern control
drivers/media/i2c/ov772x.c | 56 +++++++++++++++++++++++++++++++++++++- 1 file changed, 55 insertions(+), 1 deletion(-)
-- 2.17.1
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