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Subject[PATCH v4 0/3] media: i2c: ov772x: Enable BT656 mode and test pattern support
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Hi All,

This patch series adds support for BT656 mode in the ov772x sensor
and also enables color bar test pattern control.

Cheers,
Prabhakar

Changes for v4:
* New patch 1/3 to fallback in parallel mode.
* Switched to v4l2_fwnode_endpoint_alloc_parse() for parsing the ep.
* Dropped support for pdat for test pattern control.
* DT documentation patches [1].

Changes for v3:
* Dropped DT binding documentation patch as this is handled by Jacopo.
* Fixed review comments pointed by Jacopo.

[1] https://patchwork.kernel.org/project/linux-renesas-soc/list/?series=346809

Lad Prabhakar (3):
media: i2c: ov772x: Parse endpoint properties
media: i2c: ov772x: Add support for BT656 mode
media: i2c: ov772x: Add test pattern control

drivers/media/i2c/ov772x.c | 56 +++++++++++++++++++++++++++++++++++++-
1 file changed, 55 insertions(+), 1 deletion(-)

--
2.17.1

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