Messages in this thread | | | Subject | Re: [PATCH 4/5] selftests: firmware: Simplify test patterns | From | Shuah Khan <> | Date | Mon, 25 Apr 2022 13:48:15 -0600 |
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On 4/21/22 9:29 AM, Takashi Iwai wrote: > The test patterns are almost same in three sequential tests. > Make the unified helper function for improving the readability. > > Link: https://lore.kernel.org/all/20210127154939.13288-1-tiwai@suse.de/ > Signed-off-by: Takashi Iwai <tiwai@suse.de> > ---
Thank you. It helps with maintaining this code easier.
Reviewed-by: Shuah Khan <skhan@linuxfoundation.org>
thanks, -- Shuah
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