Messages in this thread | | | From | Andy Shevchenko <> | Date | Wed, 22 Dec 2021 14:38:13 +0200 | Subject | Re: [PATCH v11 11/15] iio: test: add basic tests for the iio-rescale driver |
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On Wed, Dec 22, 2021 at 5:47 AM Liam Beguin <liambeguin@gmail.com> wrote: > > From: Liam Beguin <lvb@xiphos.com> > > The iio-rescale driver supports various combinations of scale types and > offsets. These can often result in large integer multiplications. Make > sure these calculations are done right by adding a set of kunit test > cases that build on top of iio-test-format.
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> + int fract_mult = 100000000LL;
Perhaps also change to use the prefix?
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> + *nano = (s64)tmp * 10 * fract_mult + tmp2;
I'm also puzzled what the meaning of the 10 is here?
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> + err = 1000000 * abs(exp - real);
Prefix?
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> + err = div64_u64(err, abs(exp)); > + return (int)err;
return div64_u64();
-- With Best Regards, Andy Shevchenko
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