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SubjectRe: [PATCH v4 4/4] rtc: ds1307: add freq_test sysfs attribute to check tick on m41txx
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Oh, sorry, I've forgotten to reword commit log.
I follow with v5 patchset.
Sorry again.

Giulio

Il 16/05/2018 12:05, Giulio Benetti ha scritto:
> On m41txx you can enable open-drain OUT pin to check if offset is ok.
> Enabling OUT pin with freq_test attribute, OUT pin will tick 512 times
> faster than 1s tick base.
>
> Enable or Disable FT bit on CONTROL register if freq_test is 1 or 0.
>
> Signed-off-by: Giulio Benetti <giulio.benetti@micronovasrl.com>
> ---
> V3 => V4:
> * change attribute from freq_test to frequency_test_enable
> * use regmap_update_bits instead of regmap_write
>
> drivers/rtc/rtc-ds1307.c | 99 ++++++++++++++++++++++++++++++++++++++++
> 1 file changed, 99 insertions(+)
>
> diff --git a/drivers/rtc/rtc-ds1307.c b/drivers/rtc/rtc-ds1307.c
> index 2797d01bfa1d..de98ddc39515 100644
> --- a/drivers/rtc/rtc-ds1307.c
> +++ b/drivers/rtc/rtc-ds1307.c
> @@ -1053,6 +1053,99 @@ static int m41txx_rtc_set_offset(struct device *dev, long offset)
> ctrl_reg);
> }
>
> +static ssize_t frequency_test_enable_store(struct device *dev,
> + struct device_attribute *attr,
> + const char *buf, size_t count)
> +{
> + struct ds1307 *ds1307 = dev_get_drvdata(dev);
> + unsigned long freq_test = 0;
> + int retval;
> +
> + retval = kstrtoul(buf, 10, &freq_test);
> + if ((retval < 0) || (retval > 1)) {
> + dev_err(dev, "Failed to store RTC Frequency Test attribute\n");
> + return -EINVAL;
> + }
> +
> + regmap_update_bits(ds1307->regmap, M41TXX_REG_CONTROL, M41TXX_BIT_FT,
> + freq_test ? M41TXX_BIT_FT : 0);
> +
> + return retval ? retval : count;
> +}
> +
> +static ssize_t frequency_test_enable_show(struct device *dev,
> + struct device_attribute *attr,
> + char *buf)
> +{
> + struct ds1307 *ds1307 = dev_get_drvdata(dev);
> + int freq_test_en = 0;
> + unsigned int ctrl_reg;
> +
> + regmap_read(ds1307->regmap, M41TXX_REG_CONTROL, &ctrl_reg);
> +
> + if (ctrl_reg & M41TXX_BIT_FT)
> + freq_test_en = true;
> + else
> + freq_test_en = false;
> +
> + return sprintf(buf, "%d\n", freq_test_en);
> +}
> +
> +static DEVICE_ATTR_RW(frequency_test_enable);
> +
> +static struct attribute *rtc_freq_test_attrs[] = {
> + &dev_attr_frequency_test_enable.attr,
> + NULL,
> +};
> +
> +static const struct attribute_group rtc_freq_test_attr_group = {
> + .attrs = rtc_freq_test_attrs,
> +};
> +
> +static void rtc_calib_remove_sysfs_group(void *_dev)
> +{
> + struct device *dev = _dev;
> +
> + sysfs_remove_group(&dev->kobj, &rtc_freq_test_attr_group);
> +}
> +
> +static int ds1307_add_frequency_test(struct ds1307 *ds1307)
> +{
> + int err = 0;
> +
> + switch (ds1307->type) {
> + case m41t0:
> + case m41t00:
> + case m41t11:
> + /* Export sysfs entries */
> + err = sysfs_create_group(&(ds1307->dev)->kobj,
> + &rtc_freq_test_attr_group);
> + if (err) {
> + dev_err(ds1307->dev,
> + "Failed to create sysfs group: %d\n",
> + err);
> + return err;
> + }
> +
> + err = devm_add_action_or_reset(ds1307->dev,
> + rtc_calib_remove_sysfs_group,
> + ds1307->dev);
> + if (err) {
> + dev_err(ds1307->dev,
> + "Failed to add sysfs cleanup action: %d\n",
> + err);
> + sysfs_remove_group(&(ds1307->dev)->kobj,
> + &rtc_freq_test_attr_group);
> + return err;
> + }
> + break;
> + default:
> + break;
> + }
> +
> + return err;
> +}
> +
> /*----------------------------------------------------------------------*/
>
> static int ds1307_nvram_read(void *priv, unsigned int offset, void *val,
> @@ -1794,6 +1887,12 @@ static int ds1307_probe(struct i2c_client *client,
> if (err)
> return err;
>
> + err = ds1307_add_frequency_test(ds1307);
> + if (err) {
> + rtc_device_unregister(ds1307->rtc);
> + return err;
> + }
> +
> if (chip->nvram_size) {
> struct nvmem_config nvmem_cfg = {
> .name = "ds1307_nvram",
>

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