Messages in this thread | | | Subject | Re: [PATCH v4 4/4] rtc: ds1307: add freq_test sysfs attribute to check tick on m41txx | From | Giulio Benetti <> | Date | Wed, 16 May 2018 12:27:12 +0200 |
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Oh, sorry, I've forgotten to reword commit log. I follow with v5 patchset. Sorry again.
Giulio
Il 16/05/2018 12:05, Giulio Benetti ha scritto: > On m41txx you can enable open-drain OUT pin to check if offset is ok. > Enabling OUT pin with freq_test attribute, OUT pin will tick 512 times > faster than 1s tick base. > > Enable or Disable FT bit on CONTROL register if freq_test is 1 or 0. > > Signed-off-by: Giulio Benetti <giulio.benetti@micronovasrl.com> > --- > V3 => V4: > * change attribute from freq_test to frequency_test_enable > * use regmap_update_bits instead of regmap_write > > drivers/rtc/rtc-ds1307.c | 99 ++++++++++++++++++++++++++++++++++++++++ > 1 file changed, 99 insertions(+) > > diff --git a/drivers/rtc/rtc-ds1307.c b/drivers/rtc/rtc-ds1307.c > index 2797d01bfa1d..de98ddc39515 100644 > --- a/drivers/rtc/rtc-ds1307.c > +++ b/drivers/rtc/rtc-ds1307.c > @@ -1053,6 +1053,99 @@ static int m41txx_rtc_set_offset(struct device *dev, long offset) > ctrl_reg); > } > > +static ssize_t frequency_test_enable_store(struct device *dev, > + struct device_attribute *attr, > + const char *buf, size_t count) > +{ > + struct ds1307 *ds1307 = dev_get_drvdata(dev); > + unsigned long freq_test = 0; > + int retval; > + > + retval = kstrtoul(buf, 10, &freq_test); > + if ((retval < 0) || (retval > 1)) { > + dev_err(dev, "Failed to store RTC Frequency Test attribute\n"); > + return -EINVAL; > + } > + > + regmap_update_bits(ds1307->regmap, M41TXX_REG_CONTROL, M41TXX_BIT_FT, > + freq_test ? M41TXX_BIT_FT : 0); > + > + return retval ? retval : count; > +} > + > +static ssize_t frequency_test_enable_show(struct device *dev, > + struct device_attribute *attr, > + char *buf) > +{ > + struct ds1307 *ds1307 = dev_get_drvdata(dev); > + int freq_test_en = 0; > + unsigned int ctrl_reg; > + > + regmap_read(ds1307->regmap, M41TXX_REG_CONTROL, &ctrl_reg); > + > + if (ctrl_reg & M41TXX_BIT_FT) > + freq_test_en = true; > + else > + freq_test_en = false; > + > + return sprintf(buf, "%d\n", freq_test_en); > +} > + > +static DEVICE_ATTR_RW(frequency_test_enable); > + > +static struct attribute *rtc_freq_test_attrs[] = { > + &dev_attr_frequency_test_enable.attr, > + NULL, > +}; > + > +static const struct attribute_group rtc_freq_test_attr_group = { > + .attrs = rtc_freq_test_attrs, > +}; > + > +static void rtc_calib_remove_sysfs_group(void *_dev) > +{ > + struct device *dev = _dev; > + > + sysfs_remove_group(&dev->kobj, &rtc_freq_test_attr_group); > +} > + > +static int ds1307_add_frequency_test(struct ds1307 *ds1307) > +{ > + int err = 0; > + > + switch (ds1307->type) { > + case m41t0: > + case m41t00: > + case m41t11: > + /* Export sysfs entries */ > + err = sysfs_create_group(&(ds1307->dev)->kobj, > + &rtc_freq_test_attr_group); > + if (err) { > + dev_err(ds1307->dev, > + "Failed to create sysfs group: %d\n", > + err); > + return err; > + } > + > + err = devm_add_action_or_reset(ds1307->dev, > + rtc_calib_remove_sysfs_group, > + ds1307->dev); > + if (err) { > + dev_err(ds1307->dev, > + "Failed to add sysfs cleanup action: %d\n", > + err); > + sysfs_remove_group(&(ds1307->dev)->kobj, > + &rtc_freq_test_attr_group); > + return err; > + } > + break; > + default: > + break; > + } > + > + return err; > +} > + > /*----------------------------------------------------------------------*/ > > static int ds1307_nvram_read(void *priv, unsigned int offset, void *val, > @@ -1794,6 +1887,12 @@ static int ds1307_probe(struct i2c_client *client, > if (err) > return err; > > + err = ds1307_add_frequency_test(ds1307); > + if (err) { > + rtc_device_unregister(ds1307->rtc); > + return err; > + } > + > if (chip->nvram_size) { > struct nvmem_config nvmem_cfg = { > .name = "ds1307_nvram", >
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