Messages in this thread | | | Subject | Re: [PATCH] usb: dwc3 dwc3_exynos_probe() change goto labels to meaningful names | From | Javier Martinez Canillas <> | Date | Wed, 11 Jan 2017 14:06:01 -0300 |
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Hello Shuah,
On 01/11/2017 01:45 PM, Shuah Khan wrote: > Change goto labels to meaningful names from a series of errNs. > > Signed-off-by: Shuah Khan <shuahkh@osg.samsung.com> > --- > drivers/usb/dwc3/dwc3-exynos.c | 22 +++++++++++----------- > 1 file changed, 11 insertions(+), 11 deletions(-) > > diff --git a/drivers/usb/dwc3/dwc3-exynos.c b/drivers/usb/dwc3/dwc3-exynos.c > index f7421c2..ea50f74 100644 > --- a/drivers/usb/dwc3/dwc3-exynos.c > +++ b/drivers/usb/dwc3/dwc3-exynos.c > @@ -147,53 +147,53 @@ static int dwc3_exynos_probe(struct platform_device *pdev) > exynos->vdd33 = devm_regulator_get(dev, "vdd33"); > if (IS_ERR(exynos->vdd33)) { > ret = PTR_ERR(exynos->vdd33); > - goto err2; > + goto vdd33_err; > }
I think it's better to use as labels what will be done in the error path rather than what failed. IOW, "disable_axius_clk" or "disable_clks" are more clear than vdd33_err for me, since can give you an idea of what will happen in the error path.
But I don't have a strong opinion and your naming is an improvement over the current one, so:
Reviewed-by: Javier Martinez Canillas <javier@osg.samsung.com>
Best regards, -- Javier Martinez Canillas Open Source Group Samsung Research America
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