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Subject[PATCH 0/3] mtd: use ONFI bad blocks per LUN to calculate UBIFS bad PEB limit
Date
For ONFI-compliant NAND devices, the ONFI parameters report the maximum number
of bad blocks per LUN that will be encountered over the lifetime of the device,
so we can use that information to get a more accurate (and smaller) value for
the UBIFS bad PEB limit.

These patches are ordered in terms of their dependencies, but ideally, all 3
would need to be applied for this to work as intended.

Jeff Westfahl (3):
mtd: introduce function max_bad_blocks
mtd: nand: implement 'max_bad_blocks' mtd function
mtd: ubi: use 'max_bad_blocks' to compute bad_peb_limit

drivers/mtd/mtdpart.c | 12 ++++++++++++
drivers/mtd/nand/nand_base.c | 35 +++++++++++++++++++++++++++++++++++
drivers/mtd/ubi/build.c | 10 ++++++++++
include/linux/mtd/mtd.h | 1 +
4 files changed, 58 insertions(+)

--
2.4.0



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