Messages in this thread | | | Date | Mon, 18 Feb 2013 13:25:49 +0100 | From | Vasilis Liaskovitis <> | Subject | Re: [PATCH] ACPI / scan: Make it clear that acpi_bus_trim() cannot fail |
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Hi,
On Thu, Jan 24, 2013 at 11:56:50PM +0100, Rafael J. Wysocki wrote: > From: Rafael J. Wysocki <rafael.j.wysocki@intel.com> > > Since acpi_bus_trim() cannot fail, change its definition to a void > function, so that its callers don't check the return value in vain > and update the callers.
I have missed a few patchsets/discussions in the last month and wanted to ask a question related to this: Does the new always-succeed 2-pass trim_device design guarantee safe memory hot-remove operations?
Afaict if memory offline fails now, the device is ejected (_EJ0) anyways causing a panic. Tested in a VM with linux-next-20130207 and linux-next-20130218 by doing an SCI-eject request on a hot-plugged dimm.
Are there more patches in development for safe memory hot-remove?
thanks,
- Vasilis
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