Messages in this thread | | | Date | Mon, 4 Jan 2021 18:06:10 -0300 | From | Enzo Matsumiya <> | Subject | Re: [PATCH] nvme: hwmon: fix crash on device teardown |
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Thank you all for the feedback. I'll re-evaluate my patch and resubmit it soon.
The problem clearly exists as I can easily reproduce it on my test setup, but the strategy to fix it needs some rework apparently.
@Daniel maybe try tweaking your tests to use a smaller controller loss timeout (-l option)? I do this on my tests because the default value kicks in about 30min after hot-removal -- i.e. you have to actually wait for the timeout to expire to trigger the bug.
Cheers,
Enzo
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