Messages in this thread | | | From | Bartlomiej Zolnierkiewicz <> | Subject | Re: [PATCH 15/18] thermal: exynos: check return values of ->get_trip_[temp,hyst] methods | Date | Wed, 02 May 2018 11:41:42 +0200 |
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On Tuesday, May 01, 2018 12:43:04 PM Daniel Lezcano wrote: > On Thu, Apr 26, 2018 at 01:51:30PM +0200, Bartlomiej Zolnierkiewicz wrote: > > Check return values of ->get_trip_[temp,hyst] methods in > > exynos_tmu_initialize(). > > > > Signed-off-by: Bartlomiej Zolnierkiewicz <b.zolnierkie@samsung.com> > > --- > > drivers/thermal/samsung/exynos_tmu.c | 10 +++++++--- > > 1 file changed, 7 insertions(+), 3 deletions(-) > > > > diff --git a/drivers/thermal/samsung/exynos_tmu.c b/drivers/thermal/samsung/exynos_tmu.c > > index 244aaf6..abe0737 100644 > > --- a/drivers/thermal/samsung/exynos_tmu.c > > +++ b/drivers/thermal/samsung/exynos_tmu.c > > @@ -357,19 +357,23 @@ static int exynos_tmu_initialize(struct platform_device *pdev) > > /* Write temperature code for rising and falling threshold */ > > for (i = 0; i < ntrips; i++) { > > /* Write temperature code for rising threshold */ > > - tzd->ops->get_trip_temp(tzd, i, &temp); > > + ret = tzd->ops->get_trip_temp(tzd, i, &temp); > > + if (ret) > > + goto err; > > temp /= MCELSIUS; > > data->tmu_set_trip_temp(data, i, temp); > > > > /* Write temperature code for falling threshold */ > > - tzd->ops->get_trip_hyst(tzd, i, &hyst); > > + ret = tzd->ops->get_trip_hyst(tzd, i, &hyst); > > + if (ret) > > + goto err; > > Could this fail for 4210 ?
It can't, please see the method implementation in of-thermal.c:
static int of_thermal_get_trip_hyst(struct thermal_zone_device *tz, int trip, int *hyst) { struct __thermal_zone *data = tz->devdata;
if (trip >= data->ntrips || trip < 0) return -EDOM;
*hyst = data->trips[trip].hysteresis;
return 0; }
> > hyst /= MCELSIUS; > > data->tmu_set_trip_hyst(data, i, temp, hyst); > > } > > > > data->tmu_clear_irqs(data); > > } > > - > > +err: > > clk_disable(data->clk); > > mutex_unlock(&data->lock); > > if (!IS_ERR(data->clk_sec))
Best regards, -- Bartlomiej Zolnierkiewicz Samsung R&D Institute Poland Samsung Electronics
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