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SubjectRe: SATA exceptions triggered by XFS (since 2.6.18)
On Sun, 21 Jan 2007 11:32:02 -0600
Robert Hancock <hancockr@shaw.ca> wrote:

> It looks like what you're getting is an actual NCQ write timing out.
> That makes the bisect result not very interesting since obviously it
> wouldn't have issued any NCQ writes before NCQ support was
> implemented. Seeing as how it's also an entirely different driver I
> imagine it's a different problem than what I've been looking at.
>
> Maybe that drive just has some issues with NCQ? I would be surprised
> at that with a Seagate though..

I don't know. It's a two years old ST380817AS.


# smartctl -a -d ata /dev/sda

smartctl version 5.36 [x86_64-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus family
Device Model: ST380817AS
Serial Number: 4MR08EK8
Firmware Version: 3.42
User Capacity: 80,026,361,856 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: ATA/ATAPI-6 T13 1410D revision 2
Local Time is: Sun Jan 21 20:15:40 2007 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 47) minutes.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 059 049 006 Pre-fail Always - 215927244
3 Spin_Up_Time 0x0003 098 098 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 098 098 020 Old_age Always - 2182
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 083 060 030 Pre-fail Always - 204305750
9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 3494
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 098 098 020 Old_age Always - 2541
194 Temperature_Celsius 0x0022 024 040 000 Old_age Always - 24 (Lifetime Min/Max 0/15)
195 Hardware_ECC_Recovered 0x001a 059 049 000 Old_age Always - 215927244
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 1
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 1
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 12 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 12 occurred at disk power-on lifetime: 2516 hours (104 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 0d 5b 9d 34 e1 Error: UNC 13 sectors at LBA = 0x01349d5b = 20225371

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 4e 9d 34 e1 00 00:03:03.851 READ DMA
c8 00 00 4e 9d 34 e1 00 00:03:03.848 READ DMA
c8 00 00 4e 9d 34 e1 00 00:03:03.846 READ DMA
c8 00 00 4e 9d 34 e1 00 00:03:03.843 READ DMA
c8 00 00 4e 9d 34 e1 00 00:03:03.839 READ DMA

Error 11 occurred at disk power-on lifetime: 2516 hours (104 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 0d 5b 9d 34 e1 Error: UNC 13 sectors at LBA = 0x01349d5b = 20225371

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 4e 9d 34 e1 00 00:03:03.851 READ DMA
c8 00 00 4e 9d 34 e1 00 00:03:03.848 READ DMA
c8 00 00 4e 9d 34 e1 00 00:03:03.846 READ DMA
c8 00 00 4e 9d 34 e1 00 00:03:03.843 READ DMA
c8 00 00 4e 9d 34 e1 00 00:03:03.839 READ DMA

Error 10 occurred at disk power-on lifetime: 2516 hours (104 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 0d 5b 9d 34 e1 Error: UNC 13 sectors at LBA = 0x01349d5b = 20225371

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 4e 9d 34 e1 00 00:03:03.851 READ DMA
c8 00 00 4e 9d 34 e1 00 00:03:03.848 READ DMA
c8 00 00 4e 9d 34 e1 00 00:03:03.846 READ DMA
c8 00 00 4e 9d 34 e1 00 00:03:03.843 READ DMA
c8 00 00 16 9c 34 e1 00 00:03:03.839 READ DMA

Error 9 occurred at disk power-on lifetime: 2516 hours (104 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 0d 5b 9d 34 e1 Error: UNC 13 sectors at LBA = 0x01349d5b = 20225371

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 4e 9d 34 e1 00 00:03:03.851 READ DMA
c8 00 00 4e 9d 34 e1 00 00:03:03.848 READ DMA
c8 00 00 4e 9d 34 e1 00 00:03:03.846 READ DMA
c8 00 00 16 9c 34 e1 00 00:03:03.843 READ DMA
c8 00 00 0e 9b 34 e1 00 00:03:03.839 READ DMA

Error 8 occurred at disk power-on lifetime: 2516 hours (104 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 0d 5b 9d 34 e1 Error: UNC 13 sectors at LBA = 0x01349d5b = 20225371

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 4e 9d 34 e1 00 00:03:03.851 READ DMA
c8 00 00 4e 9d 34 e1 00 00:03:03.848 READ DMA
c8 00 00 16 9c 34 e1 00 00:03:03.846 READ DMA
c8 00 00 0e 9b 34 e1 00 00:03:03.843 READ DMA
c8 00 00 8e 99 34 e1 00 00:03:03.839 READ DMA

SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.



--
Paolo Ornati
Linux 2.6.20-rc5 on x86_64
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